| Nominal voltage(Vn)
: 63 Vdc-100Vdc-160Vdc-250Vdc-400Vdc-630Vdc-1000Vdc |
Category voltage(Vc)
: Up to 85 Vc = Vn
For temperature between +85°C and +100°C a decreasing
factor of 1.25% per degree °C on the nominal voltage Vn
has to be applied. |
| Capacitance range
: 1000 pF to 10 µF |
| Capacitance values
: Values in compliance with IEC 63 Norm. E6 series |
| Capacitance tolerances
: ±10%, ±20%(upon request ±5%) |
Total self inductance
:  8nH |
| Pitch(mm) |
10 |
15 |
22.5 |
27.5 |
| (L9Nh) |
0 |
15 |
18 |
18 |
|
| Dissipation factor(DF)
: tgd x 10-4 at +25°C ±5°C |
| KHz |
C=1µF |
C>1µF |
| 1 |
<100 |
<100 |
| 10 |
<150 |
|
|
| Insulation resistance : |
Test condition
Temperature : +25°C ±5°C
Voltage charge time : 1 minute
Votage charge : 50 Vdc for Vn 100 Vdc, 100Cdc for Vn=100Vdc
For Vn 100 Vdc :
30,000 MO for CC 0.33µF(5.10-4MO)(*)
10,000 MO for CC 0.33µF(1,700sec.)(*)
For
Vn 100Vdc :
10,000MO for C 0.1µF(5.10-4MO) (*)
10,000sec. for C 0.1µF(5,000sec.) (*)
Test
voltage between terminals : 1.6 x Vn applied for 2sec.
at +25°C ±5°C
(*) - typical value |
| Maximum pulse rise time dv/dt (V / µ
sec) : |
| Vn |
Pitch(mm) |
| 10 |
15 |
22.5 |
27.5 |
| 60 |
3 |
1.5 |
1 |
1 |
| 100 |
6 |
3 |
2 |
1 |
| 160 |
8 |
5 |
3 |
2 |
| 250 |
11 |
7 |
4 |
3 |
| 400 |
20 |
10 |
5.5 |
5 |
| 630 |
30 |
15 |
8 |
7 |
| 1000 |
60 |
15 |
15 |
10 |
|
| If the working voltage(V) is lower than nominal
voltage(Vn), the capacitor can work at higher dv/dt. In this
case the maximum value allowed is obtained by multiplying the
above value(see table) with the ratio Vn / V |
| Soldering : |
| Test
Condition |
Performance
|
| Soldering
temperature |
+260°C
±5°C |
Capacitance
change 
C/C |
<±2% |
| Soldering
duration |
10sec.
±1sec. |
DF
change
tgd |
<30. 10-4 at 10KHz
for C<1µF |
| <20. 10-4 at 0KHz
for C>1µF |
| |
|
Insulation
resistance |
< limit value |
|
| Damp heat test : |
| Test
Condition |
Performance
|
| Temperature |
+40°C |
Capacitance
change
C/C |
< ±5% |
| Relative
humidity |
93% ±2%
|
Dissipation
factor change
tgd |
<50. 10-4 at 10KHz |
| Test
duration |
56 days |
Insulation
resistance |
<50% of limit value |
|
| Lift test : |
| Test
Condition |
Performance
|
| Temperature |
+105°C |
Capacitance
change
C/C |
<±5% |
| Test
duration |
1000 Hours
|
DF
change
tgd |
<30·10-4
at 10KHz for C<1µF |
| <20·10-4
at 0KHz for C<1µF |
| Voltage
applied |
1.25 x Vn |
Insulation
resistance |
> 50% of limit value |
|
| Long term stability : |
| Test
Condition |
Performance
|
| Storage |
Standard
environmental condition |
Capacitance
change
C/C |
<±3%
for C < 0.1µF |
| <±2% for
C >0.1µF |
|
 |